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KMID : 1059520090530040466
Journal of the Korean Chemical Society
2009 Volume.53 No. 4 p.466 ~ p.470
Electronic Properties of the Oxide Film Formed in Passivation Process of Aluminum in Borate Buffer Solution
Chon Jung-Kyoon

Kim Youn-Kyoo
Abstract
KEYWORD
Aluminum oxide, passive film, oxide film, n-type semiconductor, Mott-Schottky
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