KMID : 1059520090530040466
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Journal of the Korean Chemical Society 2009 Volume.53 No. 4 p.466 ~ p.470
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Electronic Properties of the Oxide Film Formed in Passivation Process of Aluminum in Borate Buffer Solution
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Chon Jung-Kyoon
Kim Youn-Kyoo
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Abstract
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KEYWORD
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Aluminum oxide, passive film, oxide film, n-type semiconductor, Mott-Schottky
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